People of ProCams 2006
General Chairs:
Christopher Jaynes,
University of Kentucky, USA
Greg Welch,
University of North Carolina at Chapel Hill, USA
chairs@procams2006.org
Posters Chair:
Nelson Chang, Hewlett-Packard Laboratories, USA
posters@procams2006.org
Demo/Exhibition Chairs:
Doreen Maloney,
Art Exhibit Co-Chair, University of Kentucky, USA
Perry Hoberman,
Art Exhibit Co-Chair, University of Southern California, USA
Herman Towles,
Technical Exhibit Chair, University of North Carolina Chapel Hill, USA
art@procams2006.org and tech@procams2006.org
Online Activities Chairs:
Mark Ashdown, University of Tokyo, Japan
Adrian Ilie, University of North Carolina at Chapel Hill, USA
online@procams2006.org
Program Committee:
Mark Ashdown, University of Tokyo, Japan
Paul Beardsley, Mitsubishi Electric Research Laboratories, USA
Margrit Betke, Boston University, USA
Oliver Bimber, Bauhaus University, Germany
Mark Bolas, University of Southern California, Fakespace Labs, USA
Michael Brown, Nanyang Technological University, Singapore
Tat-Jen Cham, Nanyang Technological University, Singapore
Nelson Chang, Hewlett-Packard Laboratories, USA
Han Chen, IBM Research, USA
Jeremy Cooperstock, McGill University, Canada
Mark Hereld, Argonne National Laboratory, USA
Perry Hoberman, University of Southern California, USA
Masahiko Inami, University of Electro-Communcations, Japan
Christopher Jaynes, University of Kentucky, USA
Kok-Lim Low, National University of Singapore, Singapore
Aditi Majumder, University of California, Irvine, USA
David Nister, University of Kentucky, USA
Claudio Pinhanez, IBM Research, USA
Marc Pollefeys, University of North Carolina at Chapel Hill, USA
Peter Robinson, University of Cambridge, UK
Ramesh Raskar, Mistubishi Electric Research Labs, USA
Yoichi Sato, University of Tokyo, Japan
Wolfgang Stuerzlinger, York University, Canada
Rahul Sukthankar, Intel Research, Carnegie Mellon, USA
Rajeev Surati, Scalable Display Technology, USA
Kar-Han Tan, Epson Research and Development, USA
Herman Towles, University of North Carolina at Chapel Hill, USA
Jeroen van Baar, Mitsubishi Electric Research Labs, USA
Luiz Velho, IMPA, Brazil
Greg Welch, University of North Carolina at Chapel Hill, USA
Ruigang Yang, University of Kentucky, USA